Minutes, IBIS Quality Committee

05 Aug 2008

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
  Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
* David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
  Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
  Lance Wang, IOMethodology
  Lynne Green
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
* Pavani Jella, TI
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for patent disclosure:

- No one declared a patent.

AR Review:

- Mike post 1.1ag IQ spec version
  - Done

- Anders create example IBIS file with golden waveforms
  - TBD, long term

New items:

Introduction of Pavani Jella, TI
- Worked with IBIS last 4 years
- Specializing in essential I/Os and SerDes
- Interested in how to model differential receivers

Moshiul brought up last week: IQ does not cover [Series MOSFET]
- Should we add new checks now or wait?
  - Moshiul: We need someone with expertise
- Mike: Individual simulators may handle [Series MOSFET] differently
- Eckhard proposed waiting to discuss this
  - We agreed

Continued review of the IBIS Quality Specification:

5.3.12.	{LEVEL 2}  No leakage current in clamp I-V tables
- David: Normal operating range is not 0 to 2 Vcc.
- Why extrapolation?
  - Mike fills between 0 and Vcc
- Does IBISCHK combine curves?
  - Bob: It does, using linear extrapolation
- Leakage may be ODT
  - We like ODT commented
- Mike: 5.3.12-14 are related
  - 5.3.13 is mostly an s2ibis problem
  - Eckhard and Bob felt they should remain separate
- Bob: Can have leakage even with ODT
- Methods for modeling ODT in IBIS clamp tables:
  1 - s2ibis divides the voltage range into the 2 clamp tables
    - This results in double counting when extrapolated curves are summed
    - Ends can be flattened to avoid extrapolation
  2 - Each clamp covers full voltage range, has half of the current
  3 - Voltage range splitting at zero current point
  4 - All in GND Clamp, no Power Clamp
- Do we need to discuss ODT methods in the IQ spec?
- Bob: Bipolar GND might have slight negative current at 0V
- David: 5.2.12 could require no leakage where there shouldn't be any
- Bob: No one should be looking at combined tables
  - Eckhard: There really are no individual clamp tables
  - Avoid cancelling leakage curves

AR: Mike find out about IBISCHK 1uA leakage and test extrapolation

Next meeting:

12 Aug 2008 11-12 AM EST (8-9 AM PST)

Meeting ended at 12:03 PM Eastern Time.